X-ray microtomography of a corn seed showing mechanical damage by - TopicsExpress



          

X-ray microtomography of a corn seed showing mechanical damage by Francisco Guilhien. X-ray microtomography is a non-destructive technique that allows 3D internal inspection of a object with very high resolution. This video is showing a corn seed evaluated by a benchtop X-ray microtomography system (SkyScan 1172) with the objective to identify mechanical damage and how it can be depth. Observe that the chacks are occurring only in the endosperm without affect the embryonic axis. With a resolution of 6.5 micrometers, also is possible to identify the starch granules in the cotyledon. This is a project with financial supporting of FAPESP (São Paulo Research Foundation), process number 2012/24683-7.
Posted on: Thu, 16 Oct 2014 14:00:00 +0000

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